ERNST K. ZINNER Born January 30th 1937 Steyr, Austria Died July 30th 2015 St.Louis Missouri, USA

Source URL: www.astro.keele.ac.uk

• Astronomy
• Planetary science
• Outer space
• Astrochemistry
• Geophysics
• Zinner
• Leonard Medal
• Cosmic dust
• Gerald J. Wasserburg
• Meteorite
• Chondrite
• Secondary ion mass spectrometry

Technical News ●TOF-SIMS によるガラス表面の広領域マッピング TN407 Wide Area Mapping of Glass Surface by Time-of-Flight Secondary Ion Mass Spectrometry

Source URL: www.scas.co.jp

Performance and Application Examples of Secondary ion Mass Spectrometry on a FIB-SEM Microscope Platform James Whitby, Deborah Alberts, Lex Pillatsch, Leandro van Werra, Johann Michler Empa, Swiss Federal Laboratories fo

Source URL: www.univsem.eu

Technical News ●飛行時間型二次イオン質量分析法(TOF-SIMS) TN060 Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Source URL: www.scas.co.jp

the CSR could be successfully cooled down confirming the required cryogenic temperatures in the experimental vacuum chambers as well as the mechanical stability of the CSR ion optics. On March 17, 2014 the CSR project re

Source URL: www.mpi-hd.mpg.de

• Mass spectrometry
• Charge carriers
• Ions
• Semiconductor device fabrication
• Max Planck Institute for Nuclear Physics
• Vacuum
• Electron
• Static secondary-ion mass spectrometry
• Secondary ion mass spectrometry
• Physics
• Chemistry
• Science

Secondary Ion Mass Spectrometry (SIMS): Techniques and Applications in Marine and Plant Science

Source URL: sims.org.au

• Science
• Measuring instruments
• Microscopes
• Materials science
• Secondary ion mass spectrometry
• Characterization
• Microprobe
• Electron microprobe
• The Sims
• Chemistry
• Scientific method
• Mass spectrometry

Microsoft Word - nlsep2005.doc

Source URL: www.barc.gov.in

• Reflectron
• Time-of-flight mass spectrometry
• Tandem mass spectrometry
• Secondary ion mass spectrometry
• Photodissociation
• Photoelectrochemical processes
• Mass spectrum
• Fragmentation
• Ionization
• Chemistry
• Mass spectrometry
• Ion source

CONSIGLIO NAZIONALE DELLE RICERCHE Boron deposition on RFX graphite tiles studied with Secondary Ion Mass Spectrometry F. Ghezzi, A. Tolstogouzov* Istituto di Fisica del Plasma, Associazione EURATOM-CNR-ENEA

Source URL: www.ifp.cnr.it

Lunar and Planetary Science XXIXpdf POLYCYCLIC AROMATIC HYDROCARBONS IN ALH84001 ANALYZED WITH TIME-OFFLIGHT SECONDARY ION MASS SPECTROMETRY. T. Stephan1, D. Rost1, E. K. Jessberger1, and A. Greshake1,2, 1Institut

Source URL: www.lpi.usra.edu

NES Colloquium Wednesday, 07 January 2015, 10::00, OSGA/EG06 How Secondary Ion Mass Spectrometry (SIMS) helps to solve the hydrogen quantification problematic from hydrides imaging in Zirconium alloys Dr. N. Mine,

Source URL: www.psi.ch